Synchrotron-Based X-ray Spectroscopic Investigation of Nitrogen-Doped GeBi (8.4 at. ％)Te Thin Films during the Amorphous-to-Crystalline Structural Phase Transition
Journal
japanese journal of applied physics(jjap)
Date
2010.09.26
Abstract
Nitrogen-doped Ge-Bi (8.4 at. ％)Te thin films, which show a
rapidly decreasing sheet resistance and NaCl-type X-ray
diffraction peaks above 225C, were investigated by
synchrotron-radiation-based high-resolution X-ray absorption
spectroscopy (XAS) and photoelectron spectroscopy (XPS). As
the as-deposited film transformed to the crystalline phase in
an ultrahigh vacuum ambient, the N 1s and Bi 4f core levels
chemically shifted towards higher binding energies (BEs), a
lower-BE component developed at the Te 4d core level, and a
higher-BE component developed at the Ge 3d core level. The
nitrogen molecules, identified by the N K-edge absorption
spectra, decreased in intensity and some of them were
considered to have decomposed to form a N-content-increased
quaternary system.